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US 7,309,888 B2Granted
Spin based electronic device
AssigneeSeagate Technology LLC
InventorMark B. Johnson
Life of this patent
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Abstract
A thin film sensing device operates based on a spin polarized current. The spin device includes ferromagnetic layers characterized by different coercivities and/or magnetization states, and one or more low transmission barriers in between. The device is further configured so that the spin polarized current flows at least in part in a direction perpendicular to the aforementioned layers.
Claims54
A thin film spin-based device comprising:
- i) a first thin film ferromagnetic layer with a first changeable magnetization state responsive to a magnetic field coupled to the thin film spin-based device and characterized by a first coercivity;
- ii) a second thin film ferromagnetic layer with a second non-changeable magnetization state and characterized by a second coercivity which is substantially higher than said first coercivity;
- iii) a third thin film layer situated between said first thin film ferromagnetic layer and said second thin film ferromagnetic layer, said third thin film layer comprising a low transmission barrier material;
- wherein a spin polarized current flows in part in a path perpendicular to a magnetization plane of said first thin film ferromagnetic layer, to said third thin film layer, and to said second thin film ferromagnetic layer respectively;
- further wherein an impedance value of the device varies in accordance with a relationship between said first changeable magnetization state and said second non-changeable magnetization state.
2 more elements
A thin film spin polarized electron current device comprising:
- a first conductive layer separated from a separate second conductive layer;
- a first thin film ferromagnetic structure characterized by a first coercivity, and electrically coupled to said first conductive layer;
- wherein said first thin film ferromagnetic structure is configured to have a fixed magnetization state;
- a second thin film ferromagnetic structure characterized by a second coercivity substantially smaller than said first coercivity, and electrically coupled to said second conductive layer;
- wherein only said second thin film ferromagnetic structure has a changeable magnetization state responsive to an external magnetic field;
- a base layer between said first thin film ferromagnetic structure and said second thin film ferromagnetic structure, which base layer includes a material having equilibrium energy levels for electron spins which are substantially the same;
- wherein said base layer includes a first low transmission barrier at an interface to said first thin film ferromagnetic structure, and a second low transmission barrier at an interface to said second thin film ferromagnetic structure;
- wherein a spin polarized current flows in part in a path perpendicular to a magnetization plane of said second thin film ferromagnetic structure and said first thin film ferromagnetic structure;
- further wherein a value of said spin polarized current can be measured to determine a relationship between said changeable magnetization state and said second non-changeable magnetization state.
6 more elements
A thin film electron spin-based sensing device comprising:
- i) a first thin film ferromagnetic layer with a changeable magnetization state comprising permalloy and/or cobalt;
- ii) a second thin film ferromagnetic layer with a non-changeable magnetization state also comprising permalloy and/or cobalt;
- iii) at least one third thin film layer situated between said first thin film ferromagnetic layer and said second thin film ferromagnetic layer, said at least one third thin film layer comprising a material with equilibrium levels which are substantially equal for two different electron spins present in a spin polarized current, said at least one third thin film layer including a low transmission barrier interface to said first thin film ferromagnetic layer and/or said second thin film ferromagnetic layer;
- wherein said spin polarized current flows at least in part perpendicular to first and second thin film ferromagnetic layers and varies in accordance with a relationship between said changeable magnetization state and said non-changeable magnetization state.
1 more element
Dependencies are inferred from the claim text.