Work convey system, unmanned convey vehicle system, unmanned convey vehicle, and work convey method
AssigneeTokyo Electron Limited
InventorsToshihiko Iijima, Shuji Akiyama, Hiroki Hosaka, Takashi Nakao
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AssigneeTokyo Electron Limited
InventorsToshihiko Iijima, Shuji Akiyama, Hiroki Hosaka, Takashi Nakao
Estimating the term…
There is a jump in the number of devices formed on a single wafer, and it takes a lot of time to inspect a single wafer. In addition, if wafers are inspected every lot, detected wafers remain in staying in a prober until the inspection of all of the wafers is completed. Therefore, the time required to transfer the wafers of each lot to the subsequent step is delayed. As a result, it is difficult to shorten TAT (Turn-Around-Time), and it is difficult to flexibly operate the prober. A transfer system E according to the present invention includes: a host computer 1; a plurality of probers 2 under the control of the host computer 1; a plurality of RGVs 4 for delivering a wafer W to each of the probers 2, one by one, at its request; and a transfer operating unit 5, associated with the host computer, for operating the RGVs 4. The transfer operating unit 5 has a scheduler 54A and a dispatcher 54B, for preparing an operating schedule for each of the RGVs 4 on the basis of the relationship in position between each of the probers 2 and each of the RGVs 4, and for determining optimum transfer paths for the RGVs 4, to assign a corresponding one of the RGVs 4 to a corresponding one of the optimum transfer paths.
A transfer system for an object to be processed, said system comprising:
Dependencies are inferred from the claim text.