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US 7,274,027 B2Granted
Scanning systems and methods with time delay sensing
AssigneeOptometrix, Inc.
InventorRobert A. Falk
Life of this patent
Estimating the term…
Abstract
Methods and systems that excite a test structure with an excitation beam and then sense the response of the test structure after some prescribed time interval with respect to the excitation. One or more detectors detect an emission from the test structure at a location of the test structure that is offset from a position on the test structure that is coincident with the excitation beam as the beam is scanned across the test structure.
Claims17
A time resolving imaging apparatus comprising
- an excitation source for generating a excitation beam;
- a scanning device for scanning the excitation beam over a test structure;
- one or more detection devices for detecting an emission from the test structure, said detector devices being configured to detect an emission from the test structure at a location of the test structure that is offset from a position on the test structure that is coincident with the excitation beam, and for producing a signal related to a temporal signature based on the detected emission.
A time resolving imaging method comprising
- generating an excitation beam;
- scanning the excitation beam over a test structure;
- detecting one or more emissions from the test structure at a location of the test structure that is offset from a position on the test structure that is coincident with the excitation beam;
- and
- producing a signal related to a temporal signature based on the detected one or more emissions.
2 more elements
Dependencies are inferred from the claim text.