Method and apparatus for storage device read phase auto-calibration

A circuit for performing read phase auto-calibration of a storage device, the circuit comprising:

• a control unit coupled to the storage device for determining a most suitable phase among a plurality of read phases and outputting a multiplexing signal according to the most suitable phase;
• a delay chain for generating a plurality of delay signals;
• and
• a multiplexer coupled to the control unit and the delay chain for selecting a delay signal among the delay signals according to the multiplexing signal;
• wherein the control unit reads data stored in the storage device for at least two times according to at least two of the read phases and compares the read data with a predetermined pattern to determine the most suitable phase.

A circuit for performing read phase auto-calibration of a storage device, is the circuit comprising:

• a control circuit coupled to the storage device for reading given data stored in the storage device according to different read phases, determining a plurality of consecutive phases among the read phases appropriate for correctly reading the given data, and determining a most suitable phase among the consecutive phases and outputting a multiplexing signal according to the most suitable phase;
• a delay circuit for generating a plurality of delay signals;
• and
• a multiplexer coupled to the control circuit and the delay circuit for selecting a delay signal among the delay signals according to the multiplexing signal.