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US 7,256,605 B2Granted
Diagnostic circuit and method therefor
AssigneeSemiconductor Components Industries, LLC
InventorAlan R. Ball
Life of this patent
Estimating the term…
Abstract
In one embodiment, a diagnostic circuit is used to test the on-resistance of a transistor.
Claims8
A diagnostic circuit for testing a transistor comprising:
- a forward bias detection circuit operably coupled to determine a forward biased state of a transistor;
- and
- a first circuit operably coupled to form a first signal representative of a drain-to-source voltage of the transistor, to form a second signal representative of a drain current of the transistor, and to responsively indicate that an on-resistance of the transistor is less than a first value wherein the transistor and the first circuit are formed on a common semiconductor die.
A diagnostic circuit for testing a transistor comprising:
- a forward bias detection circuit operably coupled to determine a forward biased state of a transistor;
- and
- a first circuit operably coupled to form a first signal representative of a drain-to-source voltage of the transistor, to form a second signal representative of a drain current of the transistor, and to responsively indicate that an on-resistance of the transistor is less than a first value wherein the first circuit is configured to compare the second signal to the first signal and responsively form a third signal having a value that indicates the on-resistance is greater than the first value.
Dependencies are inferred from the claim text.