Semiconductor device
AssigneeMatsushita Electric Industrial Co., Ltd.
InventorsShusaku Ota, Hiroaki Segawa, Masanori Hirofuji
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Abstract
A power supply potential and a ground potential are supplied to a test-use power supply pad and a test-use ground pad, respectively. The power supply potential supplied to the test-use power supply pad is transferred to power supply lines and then to each circuit block via a test-use power supply line and a potential transfer circuit including a diode device. A voltage drop is caused by each of the diode devices. To cope with the voltage drop, however, respective sizes of the diode devices and resistance components of the potential transfer circuits are configured so that a uniform voltage drop is generated at each of the power supply lines.
Claims17
A semiconductor device comprising:
- a plurality of circuit blocks each having an independent power supply system;
- a plurality of power supply lines connected to the plurality of circuit blocks, respectively;
- a plurality of power supply pads for supplying a potential to each of the plurality of power supply lines,
- a test-use power supply line being not directly connected to any one of the plurality of circuit blocks;
- a test-use power supply pad for supplying a potential to the test-use power supply line;
- and
- a plurality of potential transfer circuits for transferring a potential from the test-use power supply line to the plurality of power supply lines.
Dependencies are inferred from the claim text.