Apparatus for measuring the static parameters of integrated circuits
AssigneeYoungtek Electronics Corporation
InventorsBily Wang, Chung-Ho Chen, Kuei-Pao Chen
Life of this patent
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Abstract
An apparatus for measuring the static parameters of integrated circuit is disclosed. When the apparatus is operated, the output mode is determined automatically according to the load of the integrated circuit. When the apparatus is operated in voltage output mode, the apparatus automatically limits the current. When the apparatus is operated at current output mode, the apparatus automatically limits the voltage. Therefore, the operation voltage and the operation current are stabilized. When the tested integrated circuit fails, the apparatus of the present invention can protect itself according to the stable operation voltage and operation current, and doesn't damage the tested integrated circuit.
Claims10
An apparatus for measuring the static parameters of integrated circuits, used for testing the static parameters of a tested integrated circuit, comprising:
- a mode-selecting switch receiving at least one limiting signal and outputting one of the limiting signals according to a mode-selecting signal;
- a main control unit providing a testing signal to the tested integrated circuit according to one of the limiting signals;
- a current sampling unit obtaining the current flowing through the tested integrated circuit and outputting a current sampling signal;
- a voltage-sampling unit obtaining the voltage of the tested integrated circuit and outputting a voltage-sampling signal;
- a comparing unit comparing the current sampling signal and the voltage-sampling signal with the limiting signals to output a logic signal;
- a logic-judging unit receiving the logic signal and outputting the mode-selecting signal;
- and
- a feedback-selecting switch connected with the main control unit, the current sampling unit and the voltage-sampling unit, wherein the feedback-selecting switch outputs one of the current sampling signal and the voltage-sampling signal according to the mode-selecting signal.
Dependencies are inferred from the claim text.