Electrical circuit and method for testing integrated circuits
AssigneeInfineon Technologies AG
InventorsHeinz Mattes, Sebastian Sattler
Life of this patent
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Abstract
An electrical circuit including a test circuit and a method of testing electrical circuits is disclosed. In one embodiment, the circuit includes a electrical short-circuit protective circuit according to the invention for protecting an input contact against short-circuit having an input which is intended for connection to a signal generator, and an output which is intended for connection to a input contact. The input contact can be decoupled from the region lying upstream of the input of the electrical short-circuit protective circuit by the electrical short-circuit protective circuit.
Claims15
A test apparatus for testing electrical circuits, including integrated circuits, in particular of dynamic A/D converters, the test apparatus comprising:
- at least one input contact configured for connection to an integrated circuit;
- an electrical short-circuit protective circuit provided for each input contact, the electrical short-circuit protective circuit comprising:
- an input configured for connection to a signal generator;
- an output configured for connection to the input contact configured for connection to the integrated circuit;
- where
- the input contact configured for connection to the integrated circuit can be decoupled from the region lying upstream of the input of the electrical short-circuit protective circuit by the electrical short-circuit protective circuit;
- the output of, in each case, one electrical short-circuit protective circuit is connected to the associated input contact configured for connection to the integrated circuit;
- a signal generator, which is configured to generate a test signal and which is connected to each input of the electrical short-circuit protective circuit or circuits via one connecting line in each case.
Dependencies are inferred from the claim text.