Device design-for-test and burn-in-board with minimal external components and increased testing capacity
AssigneeTexas Instruments Incorporated
InventorChananiel Weinraub
Life of this patent
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Abstract
The invention includes a design for device design-for-test and a burn-in-board that reduce the number of external components per device on the board. Inputs to the I/Os of a device from input means are inverted between pairs of output pins. A single resister is coupled between an output that is true (e.g., not inverted) and an output that is inverted. Thus, instead of using one or more resistors per I/O from the DUT, a single resister can be coupled between inverted and non-inverted outputs.
Claims6
A system for performing a burn-in test using a burn-in-board, comprising:
- a device-under-test, coupled to the burn-in-board, wherein the device outputs an inverted test signal at a first input/output (I/O) and outputs a non-inverted test signal at a second I/O;
- a resistor, attached to the burn-in-board, that is coupled to the first I/O and coupled to the second I/O for placing a load resistance against the inverted test signal and the non-inverted test signal;
- and
- a MUX, coupled to the first I/O;
- for multiplexing signals from a functional output and a test signal from an inverter.
A method for performing a burn-in test using a burn-in-board, comprising:
- providing a device-under-test, coupled to the burn-in-board, wherein the device outputs an inverted test signal at a first input/output (I/O) and outputs a non-inverted test signal at a second I/O;
- and
- providing a resistor, attached to the burn-in-board, that is coupled to the first I/O and coupled to the second I/O for placing a resistance against the inverted test signal and the non-inverted test signal;
- and
- multiplexing signals from functional outputs and signals from an inverter chain with a MUX that is coupled to the first I/O.
Dependencies are inferred from the claim text.