Semiconductor substrate and thin processing method for semiconductor substrate
AssigneeSeiko Epson Corporation
InventorKoji Yamaguchi
Life of this patent
Estimating the term…
Loading patent…
AssigneeSeiko Epson Corporation
InventorKoji Yamaguchi
Estimating the term…
A semiconductor substrate having a first substrate surface which includes a device area in which semiconductor devices are formed and a substrate peripheral portion which does not overlap with the device area. A concavo-convex portion is formed in the substrate peripheral portion. Preferably, a concavo-convex portion is formed in a side portion which adjoins the peripheral portion. The concavo-convex portion formed in the substrate peripheral portion or the side portion may be formed by a method such as dry etching, wet etching, mechanical grinding, electrolytic plating, nonelectrolytic plating, or patterning using one of a resin material and a metal material. A thin processing method includes forming the device area; forming the concavo-convex portion in the substrate peripheral portion; adhering the first substrate surface to a support; and grinding a second substrate surface of the semiconductor substrate, which is opposite with the first substrate surface.
A method for thin processing a semiconductor substrate, comprising:
Dependencies are inferred from the claim text.