Kelvin contact module for a microcircuit test system
AssigneeJohnstech International Corporation
InventorsJohn W. O'Sullivan, John E. Nelson
Life of this patent
Estimating the term…
Abstract
A test assembly for testing electrical performance of microcircuits contained in leadless packages has Kelvin contacts. Slider contacts in a plurality of contact assemblies slide compliantly to accommodate lack of coplanarity in terminals on the package. A resilient elastomeric block may be inserted through interior spaces of the contact assembly and in interfering relation with features of a housing that supports and aligns the contact assemblies, to apply force to the slider contacts to force them against the microcircuit terminals.
Claims5
A contact assembly for a Kelvin contact system comprising
- a) first and second separate but similar conductive slider contacts each having an elongate body of predetermined shape and an engagement surface on an end thereof;
- b) first and second similar conductive laminations, each having a similar interior space and a slot extending from the exterior of the lamination to the interior space, said slot of the first lamination conforming to the first slider contact for accepting the first slider contact and allowing sliding of the first slider contact along the slot and into and out of the interior space, said slot of the second lamination for accepting the second slider contact and allowing sliding of the second slider contact along the slot and into and out of the interior space;
- and
- c) an insulating lamination having an internal space substantially matching the conductive laminations and an exterior shape similar to that of the conductive laminations' exterior shape;
- wherein
- the contact assembly comprises the conductive laminations in overlying alignment with the insulating lamination interposed between the conductive laminations, and with the first and second slider contacts within the laminations' slots.
A contact assembly for a Kelvin contact system comprising
- a) first and second similar conductive slider contacts each having an elongate body of predetermined shape and a contact surface on an end thereof;
- b) first and second similar conductive laminations, each having a similar interior space and a slot extending from the exterior of the lamination to the interior space, said slot of the first lamination matching the predetermined of the first slider contact for accepting the first slider contact and allowing sliding of the first slider contact along the slot and into and out of the interior space, said slot of the second lamination for accepting the second slider contact and allowing sliding of the second slider contact along the slot and into and out of the interior space;
- and
- c) an insulating lamination having an internal space substantially matching the conductive laminations' and an exterior shape similar to that of the conductive laminations' exterior shape;
- wherein
- the contact assembly comprises the conductive laminations in side by side alignment with the insulating lamination interposed between the conductive laminations, and with the first and second slider contacts within the laminations' slots;
- wherein
- at least the first lamination's slot projects away from a bottom wall of the lamination defining a portion of the interior space, and wherein said wall includes a first contact foot projecting away from the interior space;
- wherein
- the second lamination includes a bottom wall adjacent to the first lamination's bottom wall, said second lamination's bottom wall having a second contact foot projecting away from the interior space and staggered with respect to the first contact foot;
- an insulating circuit board for use with a plurality of the contact assemblies, said circuit board having on a surface thereof:
- I) a first plurality of contact pads in substantial alignment along a first line;
- and
- ii) a second plurality of contact pads in substantial alignment along a second line, each contact pad of the second plurality in offset relation along the second line to a contact pad of the first plurality, wherein the offset relation between the first and second pluralities of contact pads and the spacing between the first and second pluralities of contact pads aligns an individual first contact pad with the contact assembly's first contact foot and an adjacent second contact pad with the contact assembly's second contact foot;
- and
- a test system including an insulating housing mounted on the circuit board, said housing having a plurality of side by side slots, each for accepting a single contact assembly, each of said slots aligned with a first contact pad and a second contact pad, said alignment of a slot allowing a first contact assembly first contact foot to contact a first contact pad, and allowing a second contact assembly second contact foot to contact a second contact pad.
Dependencies are inferred from the claim text.