Device for measuring aberrations in an eye-type system

A device for measuring the aberrations in an eye-type system, comprising an illumination path with notably means for transmitting an illumination beam (FE) to form by backscattering on the retina of the eye a secondary light source and a test path with notably test means in a given test plane (PA) of the phase of the wave emitted by said secondary source and emerging from the eye, characterised in that it comprises moreover:

• imaging means (L1) and eye-positioning means enabling in particular to position a predetermined plane of the eye in a focal plane of said imaging means,
• a stray reflection filtering element (FLT) whereof the centre defines with the optical centre of the imaging means (L1) a measurement axis (z), substantially centred on the pupil of the eye,
• optical separation means (LM1) placed on the measurement axis and defining the illumination path and the test path,
• on the illumination path, an illumination diaphragm, of predetermined aperture,
• optical conjugation means (L2, L3) centred on the measurement axis and enabling optical conjugation between said predetermined plane of the eye, the plane of the illumination diaphragm and the test plane,
• and characterised in that the illumination beam converges substantially at the centre of the filtering element (FLT), in that the filtering element, the illumination path, the test path, the separation means and the conjugation means are interdependent, placed on a platform (PTF1) mobile relative to the imaging means (L1) along the optical axis of said means (z), enabling adjustment, with respect to the ametropia of the eye, of the optical conjugation by said means (L1) of the retina of the eye with the centre of the filtering element, and in that the illumination diaphragm is off-centre with respect to the measurement axis, so that the stray light flux reflected by the cornea of the eye, the imaging means (L1) as well as any diopter situated between the filtering element and the cornea, is deflected from the test path by the filtering element (FLT).