Methods and apparatus for providing scan patterns to an electronic device

A method for providing scan patterns to input pins of an electronic device, each input pin being associated with built-in self-test (BIST) hardware, the BIST hardware having a production test mode and a diagnostic test mode, and the electronic device outputting one or more response signatures at output pins of the electronic device in the production test mode and outputting raw response data at said output pins in the diagnostic test mode, the method comprising:

• in production test mode, using automated test equipment (ATE) to i) provide a series of scan test patterns to said input pins, and ii) capture response signatures at said output pins and compare captured response signatures to expected response signatures, to identify a number of failing scan test patterns corresponding to each input pin;
• using the ATE to identify a number of unique labels associated with said failing scan test patterns;
• and
• in diagnostic test mode, and for each input pin, using the ATE to i) provide a second series of scan test patterns to the input pin, the scan test patterns in said second series corresponding to said identified labels for the input pin, and ii) capture raw response data.

Apparatus, comprising:

• computer-readable media;
• and
• program code, stored on the computer-readable media, to cause automated test equipment (ATE) to perform the actions of:
• placing built-in self-test (BIST) hardware of an electronic device in a production test mode, and:
• providing a first series of scan test patterns to said BIST hardware;
• capturing response signatures corresponding to said scan test patterns;
• and
• comparing said captured response signatures to expected response signatures, to identify a number of failing scan test patterns;
• identifying a number of unique labels associated with said failing scan test patterns;
• and
• placing the BIST hardware in a diagnostic test mode, and:
• providing a second series of scan test patterns to the BIST hardware, the scan test patterns in said second series corresponding to said identified labels;
• and
• capturing raw response data corresponding to said scan test patterns.