Method and system for testing a memory of a microprocessor
AssigneeAdvanced Micro Devices, Inc.
InventorTrent W. Johnson
Life of this patent
Estimating the term…
Loading patent…
AssigneeAdvanced Micro Devices, Inc.
InventorTrent W. Johnson
Estimating the term…
In one embodiment, a method may include generating a test code segment including a number of selected opcodes and executing the test code segment from a particular location within the memory for a first iteration. The method may also include saving a first test result of the execution of the test code segment after the first iteration. In addition, the method may include executing the test code segment for subsequent iterations and after each iteration of the test code segment, shifting the test code segment a predetermined number of locations from the particular location within the memory. The method may further include comparing test results of each subsequent iteration with the first test result and determining whether any of the subsequent test results are different than the first test result.
A method for testing a memory of a processor, said method comprising:
A carrier medium including program instructions which when executed by a processor implement a method comprising:
A system comprising:
A method for testing a memory of a processor, said method comprising:
A carrier medium including program instructions which when executed by a processor implement a method comprising:
A system comprising:
Dependencies are inferred from the claim text.