Semiconductor memory device and various systems mounting them
AssigneeKabushiki Kaisha Toshiba
InventorDaisaburo Takashima
Life of this patent
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Abstract
A semiconductor memory device comprises a plurality of memory cells each having a source terminal and a drain terminal and a ferroelectric capacitor having a first terminal connected to the source terminal, wherein the plurality of memory cells are connected in series, and one or more selected transistors connected to at least one terminal of the series connected memory cells to constitute a memory cell block, the memory cell block having one terminal connected to a bitline and another terminal connected to a plate electrode, and wherein two memory cell blocks, which are respectively connected to two bit lines forming a bit line pair and also connected to the same word line, are respectively connected to a first plate electrode and a second plate electrode.
Claims2
A semiconductor memory device fabricated on a substrate, comprising:
- a plurality of memory cells each having a transistor having a source terminal and a drain terminal and a ferroelectric capacitor having a first terminal connected to said source terminal and a second terminal connected to said drain terminal, a predetermined number of said plurality of memory cells being connected in series,
- wherein an electric bias applied between said first terminal and said second terminal is applied to a same direction as a surface of said substrate at active operation.
A semiconductor memory device fabricated on a substrate, comprising:
- a plurality of memory cells each having a transistor having a source terminal and a drain terminal and a ferroelectric capacitor having a first terminal connected to said source terminal and a second terminal connected to said drain terminal, and ferroelectric material connected to said first and second terminal, a predetermined number of said plurality of memory cells being connected in series,
- wherein a first surface between said ferroelectric material and said first terminal, and a second surface between said ferroelectric material and said second terminal are perpendicular to surface of said substrate.
Dependencies are inferred from the claim text.