Laser scanning unit
AssigneeSamsung Electronics Co., Ltd.
InventorMasaaki Abe
Life of this patent
Estimating the term…
Abstract
A laser scanning unit is provided which can use an inexpensive and easily manufactured fθ lens and which can further ensure good precision in adjustment. The laser scanning unit can repeatedly scan focused light onto a scan line, and includes a multi-beam light source for emitting parallel light, first and second cylindrical lenses for focusing the parallel light in a sub-scanning direction and a main scanning direction, respectively, a polygon mirror for deflecting the focused light in the main scanning direction, and an fθ lens for focusing the deflected light on the scan line.
Claims12
A laser scanning unit which can repeatedly scan focused light onto a scan line, the laser scanning unit comprising:
- a light source for emitting parallel light;
- first light focusing elements for focusing the parallel light only in a sub-scanning direction;
- second light focusing elements for focusing the parallel light only in a main scanning direction;
- an optical path changing means disposed between the first light focusing elements and the second light focusing elements for directing the focused light from the first light focusing elements to the second light focusing elements;
- light deflecting means for deflecting the focused light in the main scanning direction;
- and
- a singlet plastic fθ lens for focusing the deflected light on the scan line.
A method for controlling a thermal performance variation in a laser scanning unit, comprising the steps of:
- controlling a focal point variation caused by a wavelength change of a semiconductor laser during a temperature change;
- controlling a focal point variation caused by a thermal shrinkage of a support member for the semiconductor laser;
- controlling a focal point variation caused by a focal length change of at least a first and second light focusing element;
- and
- controlling a focal point variation caused by a focal length change of a singlet fθ lens, such that a sum of the focal point variation caused by a wavelength change of the semiconductor laser during a temperature change, the focal point variation caused by a thermal shrinkage of the support member, the focal point variation caused by a focal length change of the second light focusing element, and a focal point variation caused by a focal length change of the singlet fθ lens, is within a range of about ±2 mm.
A laser scanning unit which can repeatedly scan focused light onto a scan line, the laser scanning unit comprising:
- first and second light focusing elements for focusing parallel light in a sub-scanning direction and a main scanning direction, respectively;
- light deflecting means for deflecting the focused light in the main scanning direction;
- a singlet plastic fθ lens for focusing the deflected light on the scan line;
- and
- a light source for emitting the parallel light, wherein the light source comprises a semiconductor laser, a collimating lens, and a support member for supporting the semiconductor laser and the collimating lens,
- wherein a sum of a focal point variation caused by a wavelength change of the semiconductor laser during a temperature change, a focal point variation caused by a thermal shrinkage of the support member, a focal point variation caused by a focal length change of the second light focusing element, and a focal point variation caused by a focal length change of the singlet plastic fθ lens, is within a range of about ±2 mm.
A laser scanning unit which can repeatedly scan focused light onto a scan line, the laser scanning unit comprising:
- first and second light focusing elements for focusing parallel light in a sub-scanning direction and a main scanning direction, respectively, wherein the first light focusing element comprises a glass lens, and the second light focusing element comprises a plastic lens;
- light deflecting means for deflecting the focused light in the main scanning direction;
- a singlet plastic fθ lens for focusing the deflected light on the scan line;
- and
- a light source for emitting the parallel light, wherein the light source comprises a semiconductor laser, a collimating lens, and a support member for supporting the semiconductor laser and the collimating lens,
- wherein a sum of a focal point variation caused by a wavelength change of the semiconductor laser during a temperature change, a focal point variation caused by a thermal shrinkage of the support member, a focal point variation caused by a focal length change of the second light focusing element, and a focal point variation caused by a focal length change of the singlet plastic fθ lens, is within a range of about ±2 mm.
Dependencies are inferred from the claim text.