Framework that maximizes the usage of testhead resources in in-circuit test system

An automated test system, comprising:

• a test head which executes tests on an electrical device;
• and
• a test head management controller, the test head management controller comprising:
• a test head execution supervisor function that receives tests to be executed on the test head, determines if the received tests are high priority manually submitted tests or low priority automatically generated tests, stores the received tests in an execution queue, monitors an execution status of the test head, and
• when the test head is in an idle state,
• determines whether one or more high priority tests are pending in the execution gueue;
• if one or more high priority tests are pending, selects a high priority test and dispatches the selected high priority test to the test head for execution;
• if one or more high priority tests are not pending, determines whether one or more low priority tests are pending in the execution queue;
• and
• if one or more low priority tests are pending, selects a low priority test and dispatches the selected low priority test to the test head for execution.