Electronic device with integrally formed light emitting device and supporting member
AssigneeAdvantest Corporation
InventorsMinako Yoshida, Takahiro Yamaguchi, Masayoshi Ichikawa, Mani Soma
Life of this patent
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AssigneeAdvantest Corporation
InventorsMinako Yoshida, Takahiro Yamaguchi, Masayoshi Ichikawa, Mani Soma
Estimating the term…
An electronic device having a semiconductor circuit formed therein includes a semiconductor device in which the semiconductor circuit is formed; and a light emitting device, formed integrally with the semiconductor device, for emitting light indicating a reference position of the semiconductor device.
An electronic device in which a semiconductor circuit is formed, comprising:
A fixing member for fixing a semiconductor device having a semiconductor circuit formed therein, comprising:
An electronic device in which a semiconductor circuit is formed, manufactured by a semiconductor fabrication process, comprising:
Dependencies are inferred from the claim text.
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From the US filing history. Foreign family members aren’t listed.
Marks applied to devices
Structural arrangements therefor: interconnections for measuring or testing, e.g. probe pads
Integrated devices, or assemblies of multiple devices, comprising at least one light-emitting semiconductor element covered by group H10H20/00:…
Marks applied to devices, e.g. for alignment or identification: located on the periphery of wafers, e.g. orientation notches or lot numbers
Term ended 25 Jul 2022 (estimated)
1. Field of the Invention
The present invention relates to an electronic device and a holding member. More particularly, the present invention relates to an electronic device in which a semiconductor circuit is formed.
2. Description of the Related Art
FIG. 1 shows a test system 10 as an example of an electronic device processing system according to an embodiment of the present invention.
FIG. 2A shows a top view of an electronic device 100.
FIG. 2B shows a side view of an electronic device 100.
The invention will now be described based on the preferred embodiments, which do not intend to limit the scope of the present invention, but exemplify the invention. All of the features and the combinations thereof described in the embodiment are not necessarily essential to the invention.
FIG. 1 illustrates a test system 10 as an exemplary electronic device processing system according to an embodiment of the present invention. The test system 10 performs alignment of an electronic device 100 that is an exemplary electronic device with high precision and then tests the electronic device 100. The test system 10 includes a tester 12 and an electronic device carrying apparatus 18.
The tester 12 includes a test head 20 and a tester controller 30. The test head 20 includes an electronic device placing unit 16 and a signal input/output unit 14.