Mass analysis apparatus and method for mass analysis
AssigneeHitachi High-Technologies Corporation
InventorYoshiaki Kato
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Abstract
A mass analysis apparatus comprising a first ion source which ionizes a sample and produces sample ions, a second ion source which produces reactant ions having a polarity opposite to the polarity of the sample ions, and a mass spectrometer, wherein said second ion source is provided between said first ion source and said mass spectrometer apart from the axis of a flow of the sample ions discharged from said first ion source and emits reactant ions to the flow of sample ions discharged from said first ion source.
Claims7
A mass analysis apparatus comprising a first atmospheric pressure Ion source which ionizes a sample and produces sample ions, a shield electrode made of a cylindrical metal mesh, a corona discharge electrode provided outside said shield electrode, a second atmospheric pressure ion source equipped with a power supply which supplies a voltage to said corona discharge electrode to generate ions having a polarity opposite to that of the sample ions, and a mass spectrometer, wherein the sample ions emitted from said first atmospheric pressure ion source are introduced into said shield electrode along the central axis of said shield electrode and made to react with ions generated by said second atmospheric pressure ion source, and ions passing through said shield electrode are introduced into said mass spectrometer for mass spectroscopy.
Dependencies are inferred from the claim text.