Deposition method of TiN thin film having a multi-layer structure
AssigneeIPS Corporation
InventorsYoung Hoon Park, Sahng Kyoo Lee, Tae Wook Seo
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AssigneeIPS Corporation
InventorsYoung Hoon Park, Sahng Kyoo Lee, Tae Wook Seo
Estimating the term…
Provided is a method of depositing a metal nitride film having a multilayer structure and different deposition speeds on a substrate. The method is performed by forming a first lower metal nitride film on the substrate at a first deposition speed, forming a second lower metal nitride film on the first lower metal nitride film at a second deposition speed, and forming an upper metal nitride film having a large content of nitrogen (N) on a lower TiN film which is formed by the forming of the first lower metal nitride film and the second lower metal nitride film, at a third deposition speed, to improve stability with respect to exposure to air/moisture. The deposition speed of the metal nitride film having a multi-layer structure satisfies a relationship that the second deposition speed≧the first deposition speed≧the third deposition speed.
A method of depositing a metal nitride film having a multi-layer structure and different deposition speeds on a substrate, the method comprising the steps of:
A method of depositing a metal nitride film having a multilayer structure and different deposition speeds on a substrate, the method comprising the steps of:
A method of depositing a metal nitride film having a multilayer structure and different deposition speeds on a substrate, the method comprising the steps of:
A method of depositing a metal nitride film having a multilayer structure and different deposition speeds on a substrate, the method comprising the steps of:
Dependencies are inferred from the claim text.