US 7,251,988 B2Granted

Topography analyzing system

AssigneeHon Hai Precision Industry Co., Ltd.

InventorChuan-De Huang

Life of this patent

Estimating the term…

Loading patent…

Abstract

A topography analyzing system (10) for analyzing a topographic microstructure is provided. The topography analyzing system includes a three-dimensionally adjustable platform (12), a loading platform (13), a microscopic viewing device (14), a topography measuring device (11), and a mirror (15). The adjustable platform is adapted for adjusting the spatial positions of itself and what is loaded thereon. The loading platform is disposed on the adjustable platform and is adapted for having a workpiece (17) to be evaluated loaded thereon. The topography measuring device is aside/adjacent the adjustable platform. The topography measuring device includes a probe extending to and overhanging the workpiece for detecting topography of the workpiece. The mirror is secured at an adjustable angle relative to the three-dimensional adjustable platform and is adapted for forming a mirror image of the probe and a selected measuring area of the workpiece.

Claims3

Dependent claims

A topography analyzing system comprising:

an adjustable platform selectably movable in three-dimensional space;
a loading platform disposed on the adjustable platform, the loading platform being configured for carrying a workpiece thereon;
a topography measuring device disposed adjacent the adjustable platform, the topography measuring device comprising a probe configured for detecting a topography of the workpiece;
a mirror disposed with an angle of inclination thereof relative to the adjustable platform, the mirror being configured for forming a mirror image for the probe and a selected measuring area of the workpiece;
a microscopic viewing device configured for observing the probe and the selected measuring area by way of viewing the mirror image of the probe and the selected measuring area in the mirror;
and
an adjustable supporter positioned upon the adjustable platform, the adjustable supporter being configured for supporting the mirror and for adjusting at least one of a height and the angle of inclination of the mirror.

4 more elements

Dependencies are inferred from the claim text.

Facts

Application: 11/336,241Filed 20 Jan 2006
Priority: CN 2005 1 003314131 Jan 2005
Published: US 2006/0174383 A13 Aug 2006
Granted: 7 Aug 2007
Term ends: Not estimatedThe source records don’t support an estimate.

Classification3 codes

G01B 5/28
Measuring arrangements characterised by the use of mechanical techniques: for measuring roughness or irregularity of surfaces
G01B 11/303
For measuring roughness or irregularity of surfaces: using photoelectric detection means
G01B
Measuring length, thickness or similar linear dimensions