Sealed condition inspection device
AssigneeTetra Laval Holdings & Finance S.A.
InventorToshiro Ishida
Life of this patent
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AssigneeTetra Laval Holdings & Finance S.A.
InventorToshiro Ishida
Estimating the term…
A sealed condition inspecting device comprising a support unit for supporting an element to be inspected for a sealed condition, a pair of electrodes in contact with the portion to be inspected of the element to be inspected and supported by the support unit, an electrical variable detecting unit for detecting an electrical variable in the portion to be inspected, and a sealed condition judging means for judging the acceptability of a sealed condition based on the electrical variable. In fact, since the acceptability of a sealed condition is judged based on an electrical variable in the portion, to be inspected, whether or not a defective sealed condition has occurred can be determined independently of the subjectivity of the operator, whereby a sealed condition can be inspected for a sealed condition without unpacking them, not only inspection work can be simplified but reliability in the quality of an element to be inspected can be improved.
A sealed condition inspection device for inspecting a sealed condition of a sealed portion of a contents containing element, wherein the sealed portion is formed by portions of the element being sealed together comprising
A method of inspecting a sealed condition of an element comprising:
A sealed condition inspection device for inspecting a sealed condition of a sealed portion of a contents containing element, wherein the sealed portion is formed by portions of the element being sealed together comprising
A method of inspecting a sealed condition of an element comprising:
Dependencies are inferred from the claim text.