Integrated test-on-chip system and method and apparatus for manufacturing and operating same

A method of operating a microchip system;

• comprising:
• performing at least a first self check test after manufacturing of at least one subsystem at a first time with a control subsystem carried by the substrate and before a last step of manufacturing of the microchip system;
• and
• wirelessly transmitting results of the first self check test from the microchip system.

A microchip system, comprising:

• a substrate;
• at least a first subsystem having a first micro-electrical-mechanical structure formed on at least a first portion of the substrate, the first micro-electrical-mechanical structure operable to perform at least one physical action on at least one physical work product;
• a control subsystem carried by the substrate and operable to perform a self test of the first subsystem, wherein the self test of the first subsystem is performed during manufacturing of the microchip system and prior to manufacturing a subsequent second subsystem on the microchip system;
• an antenna;
• and
• a communications subsystem carried by the substrate, the communications subsystem coupled to the antenna and operable to wirelessly transmit self check information resulting from the self test after manufacturing of the first micro-electrical-mechanical structure and prior to complete manufacturing of the microchip system.