Programmable system for device testing and control
AssigneeAVO Multi-Amp Corporation
InventorsAaron C. Klijn, Marvin G. Miller, Francisco J. Pataro, Michael D. Willett
Life of this patent
Estimating the term…
Loading patent…
AssigneeAVO Multi-Amp Corporation
InventorsAaron C. Klijn, Marvin G. Miller, Francisco J. Pataro, Michael D. Willett
Estimating the term…
A programmable system for testing relays and controlling systems is provided. In one embodiment the present disclosure provides a programmable device capable of, for example, testing relays. The device includes a signal generator for generating signals to test relays. The device includes a memory location, and a first program stored in the memory location. The first program supports relay testing. The device includes a versioned program to support relay testing, and a processor in communication with the signal generator and the memory location. The device also includes a routine that is operable by the processor to install a versioned program in the memory location replacing the first program.
A programmable relay test device, comprising:
A method for revising a relay test device, comprising:
A programmable device, comprising:
A method for dynamically updating a relay test device, comprising:
A method for dynamically updating a relay test device, comprising:
A method for dynamically updating a relay test device, comprising:
A method for dynamically updating a relay test device, comprising:
A method for dynamically updating a relay test device, comprising:
Dependencies are inferred from the claim text.