Optical unit and associated method
AssigneeXenocs SAS
InventorsPeter Hoghoj, Aurélien Dariel, Sergio Rodrigues
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AssigneeXenocs SAS
InventorsPeter Hoghoj, Aurélien Dariel, Sergio Rodrigues
Estimating the term…
The invention relates to an optical assembly with a laterally graded reflective multilayer whose reflecting surface reflects incident X-rays under low incidence angles to produce a two-dimensional optical effect. The reflecting surface comprises a single surface conformed along two curvatures corresponding to two different directions. The invention also relates to a manufacturing method of such an optical assembly. The method includes coating a substrate already having a curvature. The invention also relates to a device for generating and conditioning X-rays for applications for angle-dispersive X-ray reflectometry. The device includes the optical assembly connected to an X-ray source so that X-rays emitted by the source are conditioned along two dimensions so as to adapt the beam emitted by the source to the sample, with the X-rays having different angles of incidence on the sample under consideration.
An optical assembly comprising a laterally graded reflective multilayer having a reflecting surface to reflect incident X-rays under low incidence angles while producing a two-dimensional optical effect, said reflecting surface comprising a single surface conformed along two curvatures corresponding to two different directions;
A method of manufacturing an optical assembly comprising a laterally graded reflective multilayer having a reflecting surface to reflect incident X-rays under low incidence angles while producing a two-dimensional optical effect, said reflecting surface comprising a single surface conformed along two curvatures corresponding to two different directions, the method comprising:
A device for generating and conditioning X-rays for angle-dispersive X-ray reflectometry, the device comprising:
A device for generating and conditioning X-rays for analytical applications, the device comprising:
Dependencies are inferred from the claim text.