Internal reference voltage generation for integrated circuit testing

A memory device, comprising:

• memory circuitry;
• a first voltage generator on the integrated circuit to generate a first voltage that is adjustable based on a supply voltage powering the integrated circuit, wherein the first voltage generator comprises a plurality of voltage dividers having different output voltages which are selectable to be output as the first voltage;
• a second voltage generator on the integrated circuit to generate a second voltage;
• a third voltage generator on the integrated circuit to generate, based on a reference voltage, one or more internal voltages to be supplied to the memory circuitry;
• and
• control circuitry to select the first voltage as the reference voltage in a test mode and to select the second voltage as the reference voltage in a non-test mode.

An integrated circuit, comprising:

• means for generating one or more internal voltages based on a reference voltage;
• means for generating a first voltage adjustable based on a supply voltage powering the integrated circuit, wherein the first voltage is selected as the reference voltage when the integrated circuit is in a test mode, and wherein the means for generating the first voltage comprises a variable voltage divider;
• and
• means for generating a second voltage which is selected as the reference voltage when the integrated circuit is in a non-test mode.

A method for testing an integrated circuit, comprising:

• supplying the integrated circuit with a supply voltage;
• placing the integrated circuit in a test mode to select one of a plurality of reference voltage generators on the integrated circuit to supply to an internal voltage generator on the integrated circuit a reference voltage that is adjustable based on the supply voltage;
• setting the selected reference voltage generator to set the reference voltage;
• and
• testing the integrated circuit with the reference voltage supplied to the internal voltage generator.

A method for testing an integrated circuit, comprising:

• supplying the integrated circuit with a supply voltage;
• placing the integrated circuit in a test mode;
• selecting one of a plurality of reference voltage generators on the integrated circuit to supply to an internal voltage generator on the integrated circuit a reference voltage that is adjustable based on the supply voltage, wherein the selected reference voltage generator comprises a plurality of voltage dividers coupled to the supply voltage;
• selecting one of a plurality of voltage dividers to generate the reference voltage;
• and
• testing the integrated circuit with the reference voltage supplied to the internal voltage generator.