A method for determining a switching state of a transistor-based switching device, the switching device including first and second sets of transistors, the transistors in each of the first and second sets being connected in parallel in such a manner that one of the transistors in each of the first and second sets has a fastest response to a bias voltage in relation to the other transistors in the same one of the first and second sets, and that another of the transistors in each of the first and second sets has a slowest response to the bias voltage in relation to the other transistors in the same one of the first and second sets , each of the transistors in the each of the first and second sets having a gate, the gate of the transistor in each of the first and second sets having the fastest response to the bias voltage being provided with a drive end, the gate of the transistor in each of the first and second sets having the slowest response to the bias voltage being provided with a detected end, said method comprising the steps of:
- A) applying a first bias voltage to the drive end of the transistor in the first set that has the fastest response so as to dispose the transistors in the first set in a first transistor state;
- B) detecting a voltage level at the detected end of the transistor in the first set that has the slowest response;
- and
- C) comparing the voltage level detected in step B) with a predetermined threshold voltage level.