Semiconductor device and method for testing semiconductor device
AssigneeFujitsu Limited
InventorGen Tsukishiro
Life of this patent
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Abstract
A method for testing a semiconductor device incorporating a controller, which generates first and second complementary signals, and a memory, which operates in accordance with the first and second complementary signals. The method includes selectively switching the first and second complementary signals to an intermediate potential signal having an intermediate potential of the complementary signals. The method further includes conducting an operational test on the second device with the first and second complementary signals and the intermediate potential signal. This method enables detection of a defective connection between the devices.
Claims20
A method for testing a semiconductor device incorporating a first device, which generates a first complementary signal and a second complementary signal that are complementary to each other, and a second device, which is connected to the first device and operates in accordance with the first and second complementary signals, the method comprising:
- selectively switching the first and second complementary signals to an intermediate potential signal having an intermediate potential of the first and second complementary signals;
- and
- conducting an operational test on the second device with the intermediate potential signal and one of the first and second complementary signals.
A method for testing a semiconductor device incorporating a first device, which generates a first complementary signal and a second complementary signal that are complementary to each other, and a second device, which is connected to the first device and operates in accordance with the first and second complementary signals, the method comprising:
- conducting an operational test on the second device with the first complementary signal and an intermediate potential signal, which is used in lieu of the second complementary signal;
- and
- conducting an operational test on the second device with the second complementary signal and an intermediate potential signal, which is used in lieu of the first complementary signal.
A semiconductor device comprising:
- a first device for generating a first complementary signal and a second complementary signal that are complementary to each other;
- a second device, connected to the first device, for operating in accordance with the first and second complementary signals;
- and
- a tester circuit for selectively switching the first and second complementary signals to an intermediate potential signal having an intermediate potential of the first and second complementary signals to conduct an operational test on the second device with the intermediate potential signal and one of the first and second complementary signals.
Dependencies are inferred from the claim text.