Automatic test equipment pin channel with T-coil compensation

An automatic test equipment (ATE) bidirectional drive channel for transmitting test signals to a device under test (DUT) and receiving signal from the DUT, comprising:

• an input/output line for connection to a DUT,
• a driver circuit connected to apply test signals to said input/output line for application to a DUT,
• a receiver circuit connected to said input/output line to receive signals produced by a DUT, said receiver circuit having an associated capacitance, and
• a first passive matching network connected to said line to at least partially compensate for said receiver circuit capacitance,
• said driver circuit comprising the combination of a current-mode driver having an associated capacitance and a voltage-mode driver, said receiver circuit comprising a comparator circuit for comparing a signal received from a DUT to a reference, further comprising a second passive matching network connected in series with said first passive matching network to at least partially compensate for said current-mode driver capacitance.

An automatic test equipment (ATE) bidirectional drive channel for transmitting test signals to a device under test (DUT) and receiving signals from the DUT, comprising:

• an input/output line for connection to a DUT,
• a driver circuit connected to apply test signals to said input/output line for application to a DUT,
• a receiver circuit connected to said input/output line to receive signals produced by a DUT, said receiver circuit having an associated capacitance, and
• a first bidirectional passive matching network connected to said line to at least partially compensate for said receiver circuit capacitance.

An automatic test equipment (ATE) bidirectional drive, channel for transmitting test signals to a device under test (DUT) and receiving signals from the DUT, comprising:

• an input/output line for connection to a DUT,
• a driver circuit connected to apply test signals to said input/output line for application to a DUT,
• a receiver circuit connected to said input/output line to receive signals produced by a DUT, said receiver circuit having an associated capacitance, and
• a first bidirectional passive matching network connected to said line to at least partially compensate for said receiver circuit capacitance,
• said driver circuit comprising the combination of a current-mode driver having an associated capacitance and a voltage-mode driver, said receiver circuit comprising a comparator circuit for comparing a signal received from a DUT to a reference, further comprising a second bidirectional passive matching network connected in series with said first bidirectional passive matching network to at least partially compensate for said current-mode drive capacitance.

An automatic test equipment (ATE) bidirectional drive channel for transmitting test signals to a device under test (DUT) and receiving signal from the DUT, comprising:

• an input/output line for connection to a DUT,
• a driver circuit connected to apply test signals to said input/output line for application to a DUT,
• a receiver circuit connected to said input/output line to receive signals produced by a DUT, said receiver circuit having an associated capacitance, and
• a first passive matching network connected to said input/output line to at least partially compensate for said receiver circuit capacitance, said matching network comprising a plurality of inductors with mutual inductive coupling.

An automatic test equipment (ATE) bidirectional drive channel for transmitting test signals to a device under test (DUT) and receiving signals from the DUT, comprising:

• an input/output line for connection to a DUT,
• a driver circuit connected to apply test signals to said input/output line for application to a DUT,
• a receiver circuit connected to said input/output line to receive signals produced by a DUT, said receiver circuit having an associated capacitance, and
• a first bidirectional passive matching network connected to said input/output line to at least partially compensate for said receiver circuit capacitance, said matching network comprising a plurality of inductors with mutual inductive coupling.