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US 7,247,846 B2Granted
Electric sector time-of-flight mass spectrometer with adjustable ion optical elements
AssigneeCiphergen Biosystems, Inc.
InventorSidney E Buttrill, Jr.
Life of this patent
Estimating the term…
Abstract
The invention provides apparatus and methods for performing time-of-flight (TOF) mass spectrometry. A TOF mass spectrometer of the present invention comprises one or more ion focusing electric sectors. At least one of the electric sectors is associated with an ion optical element. The ion optical elements comprise at least one adjustable electrode, such that the adjustable electrode is able to modify the potential experienced by an ion entering or exiting the electric sector with which it is associated.
Claims26
A tandem mass spectrometer comprising:
- an ion source;
- a first mass analyzer;
- a second mass analyzer;
- and
- an ion detector,
- wherein the ion source is configured to provide ions or fragments thereof to the first mass analyzer, the first mass analyzer is configured to provide ions or fragments thereof to the second mass analyzer, and the second mass analyzer is configured to provide ions or fragments thereof to the ion detector;
- and
- wherein the first mass analyzer comprises an electric sector time-of-flight (ES-TOF) mass analyzer, the ES-TOF mass analyzer comprising:
- an ion flight path means defining a flight path for ions and having an ion entrance and an ion exit, the ion flight path means comprising:
- at least one field free region,
- at least one electric sector having an entry and an outlet, and
- at least one trim electrode disposed at the entry or the outlet of at least one of the electric sectors, wherein the at least one trim electrode is configured to modify the potential experienced by an ion entering or exiting the electric sector.
9 more elements
A tandem mass spectrometer comprising:
- an ion source;
- a first mass analyzer;
- a second mass analyzer;
- and
- an ion detector,
- wherein the ion source is configured to provide ions or fragments thereof to the first mass analyzer, the first mass analyzer is configured to provide ions or fragments thereof to the second mass analyzer, and the second mass analyzer is configured to provide ions or fragments thereof to the ion detector;
- and
- wherein the second mass analyzer comprises an electric sector time-of-flight (ES-TOF) mass analyzer, the ES-TOF mass analyzer comprising:
- an ion flight path means defining a flight path for ions and having an ion entrance and an ion exit, the ion flight path means comprising:
- at least one field free region,
- at least one electric sector having an entry and an outlet, and
- at least one trim electrode disposed at the entry or the outlet of at least one of the electric sectors, wherein the at least one trim electrode is configured to modify the potential experienced by an ion entering or exiting the electric sector.
9 more elements
Dependencies are inferred from the claim text.