Method and system for scanning apertureless fluorescence mircroscope
AssigneeCalifornia Institute of Technology
InventorsStephen R. Quake, Guillaume Lessard, Lawrence A. Wade, Jordan M. Gerton
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Abstract
Methods and systems for operating an apertureless microscope for observing one or more features to a molecular sensitivity on objects are described. More particularly, the method includes moving a tip of a probe coupled to a cantilever in a vicinity of a feature of a sample, which emits one or more photons at a detected rate relative to a background rate of the sample based upon the presence of the tip of the probe in the vicinity of the feature. The method modifies the detected rate of the feature of the sample, whereupon the modifying of the detected rate causes the feature of the sample to enhance relative to background rate of the feature.
Claims12
A method for measuring a characteristic of biological or chemical objects using detection of photons associated with biological or chemical objects, the method comprising:
- providing a liquid environment;
- providing a tip of a probe to be movable toward a feature of a biological or chemical sample in the liquid or gas environment to influence an emission of electromagnetic energy associated with the feature of the sample, the feature and the sample being maintained on a stage;
- illuminating the tip of the probe using electromagnetic energy comprising a first intensity level as the tip of the probe moves toward the feature of the sample;
- capturing a first signal associated with the feature during a first portion of movement of the tip during a portion of time associated with illuminating the tip of the probe with the electromagnetic energy comprising the first intensity level;
- moving the tip of the probe using a tapping mode operation toward a vicinity of the feature of the sample during a second portion of movement of the tip;
- providing electromagnetic energy comprising a second intensity level associated with the feature of the sample as the tip of the probe moves toward the vicinity of the feature of the sample during the second portion of movement of the tip to cause enhancement of the tip of the probe to the second intensity level;
- determining a spatial coordinate of the stage on which the sample has maintained;
- determining a distance of the tip of the probe relative to the feature of the sample;
- and
- capturing a second signal associated with the feature to create an image of the feature of the sample.
Dependencies are inferred from the claim text.