Doping method and semiconductor device using the same
AssigneeNational Institute of Advanced Industrial Science and Technology
InventorsTetsuya Tada, Toshihiko Kanayama, Hidefumi Hiura
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Abstract
The present invention achieves a shallow junction of a source and a drain, and provides a doping method which makes device properties reproducible and a semiconductor device fabricated using the method. In the present invention, doping for the semiconductor is conducted by attaching a molecular species with a higher electron affinity or lower ionization energy out of fullerene derivatives or metallocenes to the semiconductor surface to induce charge transfer from the molecule to the semiconductor.
Claims18
A doping method comprising
- attaching a metallocene or a fullerene derivative to a semiconductor surface directly or indirectly, and generating carriers in the vicinity of the semiconductor surface by charge transfer from the metallocene or the fullerene derivative to the semiconductor surface, wherein a thin dielectric film is formed on the semiconductor surface and wherein the metallocene or the fullerene derivative is attached via the thin dielectric film.
A doping method comprising
- attaching a metallocene or a fullerene derivative to a semiconductor surface directly or indirectly, and generating carriers in the vicinity of the semiconductor surface by charge transfer from the metallocene or the fullerene derivative to the semiconductor surface, wherein a dielectric film is deposited after attaching the metallocene or the fullerene derivative to the semiconductor surface or to the thin film.
A doping method comprising
- attaching a metallocene or a fullerene derivative to a semiconductor surface directly or indirectly, and generating carriers in the vicinity of the semiconductor surface by charge transfer from the metallocene or the fullerene derivative to the semiconductor surface, wherein the attached metallocene is nickelocene.
A semiconductor device, wherein the device is produced by attaching a metallocene or a fullerene derivative to a semiconductor surface directly or indirectly and generating carriers in the vicinity of the semiconductor surface by charge transfer from the metallocene or the fullerene derivative to the semiconductor surface, wherein the device is produced by forming a thin dielectric film on the semiconductor surface and attaching the metallocene or the fullerene derivative to the surface of the dielectric film to generate carriers in the vicinity of the semiconductor surface by charge transfer from the metallocene or the fullerene derivative to the semiconductor surface.
A semiconductor device, wherein the device is produced by attaching a metallocene or a fullerene derivative to a semiconductor surface directly or indirectly and generating carriers in the vicinity of the semiconductor surface by charge transfer from the metallocene or the fullerene derivative to the semiconductor surface, wherein the attached fullerene derivative is a fluorinated C60 molecule.
A semiconductor device, wherein the device is produced by attaching a metallocene or a fullerene derivative to a semiconductor surface directly or indirectly and generating carriers in the vicinity of the semiconductor surface by charge transfer from the metallocene or the fullerene derivative to the semiconductor surface, wherein the device is produced by generating carriers via photo irradiation after attaching the metallocene or the fullerene derivative.
A semiconductor device, wherein the device is produced by attaching a metallocene or a fullerene derivative to a semiconductor surface directly or indirectly and generating carriers in the vicinity of the semiconductor surface by charge transfer from the metallocene or the fullerene derivative to the semiconductor surface, wherein a dielectric film is deposited and a gate electrode is further formed thereon after attaching the metallocene or the fullerene derivative.
Dependencies are inferred from the claim text.