Semiconductor device and method for producing the same
AssigneeMatsushita Electric Industrial Co., Ltd.
InventorsKeiji Yamane, Tetsuo Ueda, Takashi Miyamoto, Isao Kidoguchi
Life of this patent
Estimating the term…
Abstract
A method for producing a semiconductor device of the present invention includes forming a surface electrode on a semiconductor element, forming a solder layer by plating on one principal surface of the surface electrode, mounting the semiconductor element on the sub-mount so that the solder layer contacts a principal surface of the sub-mount, and bonding the sub-mount and the semiconductor element to each other via the solder layer.
Claims29
A method for producing a semiconductor device, comprising:
- forming a surface electrode on a semiconductor element;
- forming a solder layer by plating on one principal surface of the surface electrode;
- placing the semiconductor element on a sub-mount so that the solder layer contacts a principal surface of the sub-mount;
- and
- bonding the sub-mount and the semiconductor element to each other via the solder layer,
- wherein the solder layer is partially formed on the surface electrode, the surface electrode has an exposed portion, and before mounting the semiconductor element on the sub-mount, a covering layer having a flatness different from that of the surface electrode is formed on the solder layer.
A method for producing a semiconductor device, comprising:
- forming a surface electrode on a semiconductor element;
- forming a solder layer by plating on one principal surface of the surface electrode;
- placing the semiconductor element on a sub-mount so that the solder layer contacts a principal surface of the sub-mount;
- bonding the sub-mount and the semiconductor element to each other via the solder layer;
- and
- bonding a base and the sub-mount to each other via a solder layer for a base, before mounting the semiconductor element on the sub-mount,
- wherein the solder layer for a base is formed on one of the sub-mount and the base,
- a plating layer containing Au is formed on the other of the sub-mount and the base in a case where the solder layer for a base contains an alloy of Au and Sn, and a plating layer containing Ag is formed on the other of the sub-mount and the base in a case where the solder layer for a base contains an alloy of Ag and Sn, and
- in order to bond the base and the sub-mount to each other, heating is performed so that the solder layer for a base and the plating layer are melted.
A method for producing a semiconductor device, comprising:
- forming a surface electrode on a semiconductor element;
- forming a solder layer by plating on one principal surface of the surface electrode;
- placing the semiconductor element on a sub-mount so that the solder layer contacts a principal surface of the sub-mount;
- bonding the sub-mount and the semiconductor element to each other via the solder layer;
- and
- bonding a base and the sub-mount to each other via a solder layer for a base, after bonding the sub-mount and the semiconductor element to each other via the solder layer,
- wherein the solder layer for a base is formed on one of the sub-mount and the base,
- a plating layer containing Au is formed on the other of the sub-mount and the base in a case where the solder layer for a base contains an alloy of Au and Sn, and a plating layer containing Ag is formed on the other of the sub-mount and the base in a case where the solder layer for a base contains an alloy of Ag and Sn, and
- in order to bond the base and the sub-mount to each other, heating is performed so that the solder layer for a base and the plating layer are melted.
A method for producing a semiconductor device, comprising:
- forming a surface electrode on a semiconductor element;
- forming a solder layer by plating on one principal surface of the surface electrode;
- placing the semiconductor element on a sub-mount so that the solder layer contacts a principal surface of the sub-mount;
- and
- bonding the sub-mount and the semiconductor element to each other via the solder layer,
- wherein the solder layer is partially formed on the surface electrode, the surface electrode has an exposed portion, and before mounting the semiconductor element on the sub-mount, a covering layer having a flatness different from that of the surface electrode is formed on the solder layer, and
- wherein an entire region for forming the solder layer on the surface electrode is inside of the principal surface of the semiconductor element where the surface electrode is formed.
Dependencies are inferred from the claim text.