Spectrometer system for optical reflectance measurements
AssigneesUniversity of Massachusetts, NIRStat LLC
InventorsBabs R. Soller, Patrick G. Phillipps, Michael S. Parker
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AssigneesUniversity of Massachusetts, NIRStat LLC
InventorsBabs R. Soller, Patrick G. Phillipps, Michael S. Parker
Estimating the term…
A spectrometer system includes a thermal light source for illuminating a sample, where the thermal light source includes a filament that emits light when heated. The system additionally includes a spectrograph for measuring a light spectrum from the sample and an electrical circuit for supplying electrical current to the filament to heat the filament and for controlling a resistance of the filament. The electrical circuit includes a power supply that supplies current to the filament, first electrical components that sense a current through the filament, second electrical components that sense a voltage drop across the filament, third electrical components that compare a ratio of the sensed voltage drop and the sensed current with a predetermined value, and fourth electrical components that control the current through the filament or the voltage drop across the filament to cause the ratio to equal substantially the predetermined value.
A spectrometer system comprising:
A method of controlling a spectrum of light emitted from a heated filament, the method comprising:
A spectrometer system comprising:
A method for correcting a spectrum measured by a spectrometer system having a spectrograph and a light source for illuminating a sample with light output from the light source, the method comprising:
Dependencies are inferred from the claim text.