Very fast time resolved imaging in multiparameter measurement space
AssigneeArete Associates
InventorAnthony D. Gleckler
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AssigneeArete Associates
InventorAnthony D. Gleckler
Estimating the term…
Plural electronic or optical images are provided in a streak optical system, as for instance by use of plural slits instead of the conventional single slit, to obtain a third, fourth, etc. dimension—rather than only the conventional two, namely range or time and azimuth. Such additional dimension or dimensions are thereby incorporated into the optical information that is to be streaked and thereby time resolved. The added dimensions may take any of an extremely broad range of forms, including wave-length, polarization state, or one or more spatial dimensions—or indeed virtually any optical parameter that can be impressed upon a probe beam. Resulting capabilities remarkably include several new forms of lidar spectroscopy, fluorescence analysis, polarimetry, spectropolarimetry, and combinations of these, as well as a gigahertz wavefront sensor.
A streak lidar imaging system for measurements of a medium with any objects therein;
A lidar imaging system for optical measurements of a medium with any objects therein;
A streak lidar imaging system for making measurements of a medium with any objects therein;
A streak lidar imaging system for making measurements of a medium with any objects therein;
A streak lidar imaging system comprising:
Dependencies are inferred from the claim text.