Material analysis including density and moisture content determinations
AssigneeTransTech Systems, Inc.
InventorsRonald W. Gamache, Richard Hosterman, Sarah Pluta
Life of this patent
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AssigneeTransTech Systems, Inc.
InventorsRonald W. Gamache, Richard Hosterman, Sarah Pluta
Estimating the term…
A system, method and program product for determining the in-place engineering properties such as density and moisture content of many varieties of engineering materials, are disclosed. The invention also includes a database, material model and sensor model for use with the above-described aspects. In one embodiment, the invention determines a compaction indication of the material based on an effect of impedance characteristics of the material on an electrical field, and corrects the compaction indication for at least one of a sensor depth-sensitivity inaccuracy and a compaction process inaccuracy. The compaction indication is determined based on a material model, and the corrections are based on mathematical and empirical models of the compaction process and the sensor.
A material analyzer system comprising:
A method for determining a compaction of a material, the method comprising the steps of:
A computer program product comprising a computer useable medium having computer readable program code embodied therein for determining a compaction indication of a material, the program product comprising:
A material analyzer system comprising:
Dependencies are inferred from the claim text.