Method and system for sampling a signal
AssigneeSilicon Laboratories Inc.
InventorShyam S. Somayajula
Life of this patent
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AssigneeSilicon Laboratories Inc.
InventorShyam S. Somayajula
Estimating the term…
A system includes a digital circuit that may be clocked by a digital clock signal having an associated clock period. The system also includes a sample clock generation circuit coupled to a sampling circuit. The sample clock generation circuit may be configured to receive an input clock having a fixed phase relationship with respect to the digital clock signal. The sample clock generation circuit may also generate a sample clock having a first sampling edge corresponding to a first relative offset within the clock period and a subsequent sampling edge corresponding to a different relative offset within the clock period. The sampling circuit may be configured to sample a designated signal upon a first sampling instance corresponding to the first sampling edge and to sample the designated signal upon a subsequent sampling instance corresponding to the subsequent sampling edge.
A system comprising:
A method comprising:
A system comprising:
A method comprising:
Dependencies are inferred from the claim text.