Cleaning system, device and method

A method for testing semiconductor devices in an automatic cleaning mode, the method comprising:

• performing testing of semiconductor devices;
• during the testing operation, automatically determining that a cleaning is to be performed;
• automatically determining the location of a working surface of a cleaning device based on a characteristic of the working surface by directing optical energy towards the working surface of the cleaning device and determining the location of the working surface of the cleaning device based on the optical energy reflected off of the working surface of the cleaning device;
• performing the cleaning using the cleaning device;
• and
• continuing the testing of semiconductor devices.

A method for testing packaged semiconductor devices, the method comprising:

• performing testing of the packaged semiconductor devices;
• during the testing operation, automatically determining that a cleaning is to be performed;
• automatically determining the location of a working surface of a cleaning device based on a characteristic of the working surface by directing optical energy towards the working surface of the cleaning device and determining the location of the working surface of the cleaning device based on the optical energy reflected off of the working surface of the cleaning device;
• performing the cleaning using the cleaning device;
• and
• continuing testing of packaged semiconductor devices.