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US 7,196,536 B2Granted
Method and apparatus for non-contact electrical probe
AssigneeAgilent Technologies, Inc.
InventorsMichael J. Nystrom, Gloria E. Hofler
Life of this patent
Estimating the term…
Abstract
Methods and apparatus for non-contact electrical probes are described. In accordance with the invention, non-contact electrical probes use negative or positive corona discharge. Non-contact electrical probes are suited for testing of OLED flat panel displays.
Claims18
An apparatus for non-contact testing of a device under test comprising:
- an electrode comprising a radius of curvature;
- a flat electrode comprising a first face, a second face and an aperture, said first face of said flat electrode separated from said electrode by a first gap and positioned such that said aperture is aligned with said electrode and wherein a steering structure is disposed in said first gap;
- and
- a device under test interface is separated from said second face of said flat electrode by a second gap.
1 more element
A method for making a non-contact testing of a device under test comprising:
- providing an electrode comprising a radius of curvature;
- positioning a flat electrode comprising a first face, a second face and an aperture such that said first face of said flat electrode is separated from said electrode by a first gap and such that said aperture is aligned with said electrode, disposing a steering structure in said first gap;
- and
- positioning a device under test interface such that it is separated from said second face of said flat electrode by a second gap.
1 more element
Dependencies are inferred from the claim text.