Circuit property measurement method
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsHiroyuki Hoshi, Hitoshi Kurusu
Life of this patent
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Abstract
In a high frequency circuit property measurement method, prior to property measurements of a high frequency circuit with RF measurement probe heads, RF measurement probe heads are calibrated using a calibration pattern comprising a signal line having a characteristic impedance and extending on a dielectric substrate, a first GND pad having one end disposed close to and at an interval from a first end of the signal line, a second GND pad having one end disposed close to and at an interval from a second end of the signal line, and a conductor electrically coupling the first GND pad to the second GND pad.
Claims1
A circuit property measurement method comprising:
- preparing a calibration pattern comprising a substrate, a signal line having a characteristic impedance and first and second ends on said substrate, said signal line directly connecting the first end to the second end, a first constant potential line having a first end disposed close to and at a predetermined interval from the first end of said signal line, a second constant potential line having a first end disposed close to and at a predetermined interval from the second end of said signal line, and a conductor electrically coupling said first constant potential line to said second constant potential line;
- and
- calibrating first and second property measurement probe heads having identical electrical arrangements consisting of spaced apart signal and constant potential terminals arranged in the same order on both of said first and second property measurement probe heads, by bringing said signal terminal and said constant potential terminal of said first property measurement probe head into contact with the first end of said signal line and the first end of said first constant potential line of said calibration pattern, respectively, and by bringing said signal terminal and said constant potential terminal of said second property measurement probe head into contact with the second end of said signal line and the first end of said second constant potential line of said calibration pattern, respectively.
Dependencies are inferred from the claim text.