X-tree test method and apparatus in a multiplexed digital system
AssigneeAgilent Technologies, Inc.
InventorsDayton Norrgard, Stephen Hird, John Siefers
Life of this patent
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Abstract
An X-Tree test apparatus for testing combinatorial logic circuits in a multiplexed digital system. The apparatus includes a plurality of contacts for electrical connection with pins on a device under test. A first driver drives a logic one signal, and a second driver drives a logic zero signal, both of which are used for testing the device. Multiplexing circuitry selectively connects the first driver and the second driver with each of the plurality of contacts and device pins. A receiver, connected with the device under test, measures a response from the logic circuit under test to the logic one and zero signals to determine if it functions as intended.
Claims12
An apparatus for testing a device under test, comprising:
- a plurality of contacts for electrical connection with a device under test;
- a first driver for driving a first logic signal;
- a second driver for driving a second logic signal, having a different value from the first logic signal;
- circuitry for selectively connecting the first driver and the second driver with each of the plurality of contacts;
- and
- a receiver, connected with the device under test, for measuring a response from the device under test to the first logic signal and the second logic signal applied, respectively, from the first driver and the second driver via the circuitry.
A method for testing a device under test, comprising:
- providing a plurality of contacts for electrical connection with a device under test;
- driving a first logic signal to the device under test via the contacts;
- driving a second logic signal to the device under test via the contacts, the second logic signal having a different value from the first logic signal;
- selectively providing the first logic signal and the second logic signal to the device under test via the plurality of contacts;
- and
- measuring a response from the device under test to the first logic signal and the second logic signal.
Dependencies are inferred from the claim text.