Calculating differential scattering parameters
AssigneeIntel Corporation
InventorJeff W. Loyer
Life of this patent
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Abstract
In one embodiment, the present invention includes a method for simulating a first stimulus into a device under test and measuring first single-ended scattering parameters caused thereby, and directly calculating a differential scattering parameter from the first single-ended scattering parameters. In certain embodiments, second single-ended scattering parameters may be obtained from a second stimulus into the device under test, and the results used to calculate the differential scattering parameter, for example, where a device under test is non-homogeneous.
Claims20
A method comprising:
- directly calculating in a simulation a differential scattering parameter of a device under test solely from a plurality of single-ended scattering parameters according to a simulation circuit of the device under test using a plurality of transmission parameters obtained from a first stimulus and a second stimulus, via adding a first transmission parameter from the first stimulus and a first transmission parameter from the second stimulus and subtracting a second transmission parameter from the first stimulus and a second transmission parameter from the second stimulus, the simulation circuit comprising a plurality of voltage controlled voltage source;
- and
- storing the differential scattering parameter for later use in the simulation.
A method comprising:
- obtaining a user input regarding whether a simulation device under test includes matched input ports;
- simulating a first stimulus into the simulation device under test and measuring first single-ended scattering parameters caused thereby;
- simulating a second stimulus into the simulation device under test and measuring second single-ended scattering parameters caused thereby if the simulation device under test does not include the matched input ports;
- directly calculating a differential scattering parameter from at least the first single-ended scattering parameters;
- and
- outputting the differential scattering parameter to the user.
An article comprising a machine-accessible storage medium containing instructions that if executed enable a system to:
- directly calculate in a simulation a differential scattering parameter of a device under test solely from a plurality of single-ended scattering parameters according to a simulation circuit for the device under test using a plurality of transmission parameters obtained from a first stimulus and a second stimulus, via addition of a first transmission parameter from the first stimulus and a first transmission parameter from the second stimulus and subtraction of a second transmission parameter from the first stimulus and a second transmission parameter from the second stimulus to obtain the differential scattering parameter, the simulation circuit comprising a plurality of voltage controlled voltage sources;
- and
- store the differential scattering parameter in the system for later use in the simulation.
A system comprising:
- a processor;
- and
- a dynamic random access memory coupled to the processor including instructions that if executed enable the system to calculate a simulated differential scattering parameter solely from a plurality of simulated single-ended scattering parameters of a simulation circuit for a device under test using a plurality of transmission parameters obtained from a first stimulus and a second stimulus, via addition of a first transmission parameter from the first stimulus and a first transmission parameter from the second stimulus and subtraction of a second transmission parameter from the first stimulus and a second transmission parameter from the second stimulus to obtain the simulated differential scattering parameter the simulation circuit comprising a plurality of series-coupled voltage sources each representative of one of the plurality of simulated single-ended scattering parameters obtained at an output port of the device under test, and to output the simulated differential scattering parameter from the system.
Dependencies are inferred from the claim text.