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US 7,127,280 B2Granted
Apparatus and process for examining a surface
AssigneeL'oreal
InventorChristophe Dauga
Life of this patent
Estimating the term…
Abstract
An apparatus designed to examine a surface includes a polarization analyser element, or analyser, placed in the path of a light beam reflected by the surface, a device configured to take digital images and placed in the path of the beam reflected by the surface downstream of the analyser, and a processing unit capable of calculating the color and the intensity of a plurality of pixels of at least one image.
Claims23
An apparatus for examining a surface, comprising:
- a polarization analyser element placed in a path of a light beam reflected by the surface, the polarization analyser element constructed and arranged to alternately transmit a crossed polarization state and a parallel polarization state;
- a digital image acquisition device disposed in the path of the beam reflected by the surface downstream of the polarization analyser element;
- and
- a processing unit configured to calculate a brightness and a color of a plurality of points of the surface from pixels of at least two images of the surface;
- wherein the apparatus is constructed and arranged to examine the surface without contacting the surface.
2 more elements
A process for a non-contact examination of a keratinous surface, comprising:
- (i) analysing crossed and parallel polarizations of a light beam reflected by the surface;
- (ii) taking digital images of the crossed and parallel polarizations of the reflected beam;
- and
- (iii) calculating a brightness and a color of a plurality of points of the surface from pixels of at least two images of the surface.
1 more element
An apparatus for examining a surface comprising:
- a source of polarized light constructed and arranged to emit a beam incident on the surface to be examined, a spectrum of the light being substantially the same as a solar spectrum;
- a polarization analyzer element placed in a path of a light beam reflected by the surface;
- a digital image acquisition device disposed in the path of the beam reflected by the surface downstream of the polarization analyzer element;
- and
- a processing unit configured to calculate a brightness and a color of a plurality of points of the surface from pixels of at least two images of the surface;
- wherein the apparatus is constructed and arranged to examine the surface without contacting the surface.
3 more elements
An apparatus for examining a surface comprising:
- an optical element selected from the group consisting of an orientable polarization analyser element and a polarizing splitter cube placed in a path of a light beam reflected by the surface;
- a first and a second camera configured to take digital images, the first and the second camera being placed in the path of the beam reflected by the surface downstream of the polarization analyser element;
- and
- a processing unit configured to calculate a brightness and a color of a plurality of points of the surface from pixels of at least two images of the surface;
- wherein the apparatus is constructed and arranged to examine the surface without contacting the surface.
2 more elements
Dependencies are inferred from the claim text.