Interface comprising a thin PCB with protrusions for testing an integrated circuit

A test device for testing an integrated circuit comprising a plurality of contacts, called a test circuit, intended to be tested w.ith the aid of a test printed circuit, called a main circuit, the test device comprising:

• an insulating, non-conductive membrane of a soft material having two opposite surfaces;
• two conductive layers each arranged on a respective one of the opposite surfaces of said membrane;
• a connection device which interconnects said two conductive layers, said two conductive layers being adapted to contact with the test circuit and the main circuit respectively, under the influence of a pressing force exerted during the test between the test circuit and the main circuit deforming the test device, said connection device being metallized holes passing through said membrane and through said two conductive layers;
• and
• protrusions arranged on at least one of said two conductive layers according to a predefined pattern as a function of said plurality of contacts of the test circuit, so as to ensure a contact quality between said at least one layer and the test circuit or the main circuit in contact with said at least one layer, under the influence of said pressing force.