Evaluation of the characteristics of electric pulses
AssigneeiROC Technologies
InventorMichael Nicolaidis
Life of this patent
Estimating the term…
Abstract
A circuit for evaluating characteristics of duration and/or shape of an electric pulse induced in an element of an integrated circuit comprising an assembly of elements, each element being likely to receive an occasional external disturbance generating an electric pulse in the element, and a measurement circuit connected to the elements to determine said characteristics of an electric pulse generated in one of the elements.
Claims19
A circuit for evaluating duration or shape characteristics of an electric pulse induced in an element of an integrated circuit, comprising:
- an assembly of elements (D1 to Dn;
- d1 to dn), each element being likely to receive an occasional external disturbance generating an electric pulse in the element, wherein an element is an OR gate, an AND gate, an inverter or any element in a cell library;
- and
- a measurement circuit (B1 to Bn, 1;
- b1 to bn,) connected to the elements to determine said characteristics of an electric pulse generated in one of the elements.
A method for evaluating duration or shape characteristics of an electric pulse induced in an integrated circuit element, comprising the steps of:
- forming a circuit comprising a plurality of elements, each element being likely to receive an occasional external disturbance generating an electric pulse in the element;
- wherein an element is an OR gate, an AND gate, an inverter or any element in a cell library;
- and
- determining, by means of a measurement device connected to the elements, said characteristics of an electric pulse generated in one of the elements.
Dependencies are inferred from the claim text.