Power MOSFET and methods of making same
AssigneeKin-On Johnny Sin
InventorsKin On Johnny Sin, Mau Lam Tommy Lai
Life of this patent
Estimating the term…
Loading patent…
AssigneeKin-On Johnny Sin
InventorsKin On Johnny Sin, Mau Lam Tommy Lai
Estimating the term…
A method of forming a power MOSFET having a substrate of a first conductivity type and a body region of a second conductivity type. The method includes the steps of forming a gate region of a pre-determined pattern and with a plurality of gate elements partially covering the substrate. The gate element has a stepped cross-sectional profile with a thicker portion and a thinner portion. The thicker portion is adapted to substantially prevent passage of impurities therethrough into the substrate during the impurities implantation step. The thinner portion is adapted to allow partial passage of impurities therethrough during the impurities implantation step. Impurities are implanted into the substrate from the gate region side of the substrate to form a body region of the second conductivity type. After the impurities implantation step, a step-profiled body region, having a shallow body region and a deep body region, is formed in the substrate with impurities also present underneath pre-determined regions of the gate elements.
A method of forming a power MOSFET comprising a substrate of a first conductivity type and a body region of a second conductivity type, including the steps of:
A power MOSFET comprising a substrate of a first conductivity type including a plurality of gate elements partially covering the substrate which collectively form the gate of said power MOSFET, said gate elements having a stepped cross-sectional profile, and a body region of a second conductivity type that comprises a thinner shallow body region underneath said gate elements and a thicker deep body region in the portion of said substrate not covered by said gate region and not masked by other blocking means, wherein the thickness of said thinner shallow body region does not exceed 2.0 μm.
A power MOSFET comprising a substrate of a first conductivity type including a plurality of gate elements partially covering the substrate which collectively form the gate of said power MOSFET, said gate elements having a stepped cross-sectional profile, and a body region of a second conductivity type wherein said body region has a stepped profile, the step width of said body region and the step width of said gate element being comparable.
Dependencies are inferred from the claim text.