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US 7,126,114 B2Granted
Method and system for mass analysis of samples
AssigneeMDS Inc.
InventorIgor Chernushevich
Life of this patent
Estimating the term…
Abstract
A system and method of analyzing a sample is described. The system includes an ion source and a deflector for producing a plurality of ion beams each of which is detected in distinct detection regions. A detection system uses the information obtained from the detection region to analyze the sample.
Claims31
A method of analyzing a sample, the method comprising:
- producing a source beam of analyte ions from the sample;
- by the steps of deflecting and pulsing, generating from the source beam at least a first beam of first select packets of analyte ions and a second beam of second select packets of analyte ions, the step of deflecting to deflect the source beam with an electric field so that the at least first and second beams are offset from each other to propagate along different paths, and the step of pulsing to generate the packets of analyte ions from either the source beam or the at least first and second beams, the steps of deflecting and pulsing to generate the at least first and second select packet of analyte ions different from each other and offset from each other in both time and space;
- detecting the select packets of analyte ions of the at least first and second beams in respective at least first and second detection regions;
- and
- performing a mass analysis of the sample based on the detected select packets of analyte ions.
2 more elements
A system for analyzing a sample, the system comprising:
- an ion source derived from the sample for producing a source beam of analyte ions;
- a deflector to deflect the source beam with an electric field so that the at least first and second beams are offset from each other to propagate along different paths;
- a pulse generator to generate packets of analyte ions from either the source beam or the at least first and second beams, the deflector and pulse generator to generate packets of analyte ions different from each other and offset from each other in both time and space;
- at least a first and second detection region to detect select packets of analyte ions from the respective at least first and second beams;
- and
- an analyzer to perform a mass analysis of the sample based on the detected select packets of analyte ions.
3 more elements
A method of analyzing a sample with a time-of-flight mass analyzer, the method comprising:
- producing a source beam of analyte ions from the sample;
- by the steps of deflecting and pulsing, generating from the source beam at least a first beam of first select packets of analyte ions and a second beam of second select packets of analyte ions, the step of deflecting to deflect the source beam with an electric field so that the at least first and second beams are offset from each other to propagate along different paths, and the step of pulsing to generate the packets of analyte ions from either the source beam or the at least first and second beams, the steps of deflecting and pulsing to generate the at least first and second select packet of analyte ions different from each other and offset from each other in both time and space;
- detecting the select packets of analyte ions of the at least first and second beams in respective at least first and second detection regions;
- and
- performing a mass analysis of the sample using a time of flight analyzer based on the detected select packets of analyte icons.
2 more elements
A system for analyzing a sample with a time-of-flight mass spectrometer, the system comprising:
- an ion source derived from the sample for producing a source beam of analyte ions;
- a deflector to deflect the source beam with an electric field so that the at least first and second beams are offset from each other to propagate along different paths;
- a pulse generator to generate packets of analyte ions from either the source beam or the at least first and second beams, the deflector and pulse generator to generate the at least first and second select packets of analyte ions different from each other and offset from each other in both time and space;
- at least a first and second detection region to detect select packets of analyte ions from the respective at least first and second beams;
- and
- a time of flight analyzer for analyzing the sample based on the detected select packets of analyte ions.
3 more elements
Dependencies are inferred from the claim text.