Method of crystallizing a nitride III-V compound semiconductor layer on a sapphire substrate
AssigneeSony Corporation
InventorEtsuo Morita
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AssigneeSony Corporation
InventorEtsuo Morita
Estimating the term…
To improve crystallographic property of a nitride III-V compound semiconductor layer grown on a sapphire substrate, a plurality of recesses are made on a major surface of the sapphire substrate, and the nitride III-V compound semiconductor layer is grown thereon. At least a part of the inner surface of each recess makes an angle not less than 10 degrees with respect to the major surface of the sapphire substrate. The recesses are buried with nitride III-V compound semiconductor crystal having a higher Al composition ratio than the nitride III-V compound semiconductor layer, such as AlxGa1-xN crystal whose Al composition ratio x is 0.2 or more, for example. Each recess has a depth not less than 25 nm and a width not less than 30 nm. The recesses may be made either upon thermal cleaning of the sapphire substrate or by using lithography and etching, thermal etching, or the like.
A manufacturing method of a semiconductor device using a nitride III-V compound semiconductor layer grown on a sapphire substrate comprising:
A manufacturing method of a semiconductor device using a nitride III-V compound semiconductor layer grown on a sapphire substrate comprising:
A manufacturing method of a semiconductor device using a nitride III-V compound semiconductor layer grown on a sapphire substrate comprising:
Dependencies are inferred from the claim text.