Method and system for improved ATE timing calibration at a device under test
AssigneeCredence Systems Corporation
InventorMasashi Shimanouchi
Life of this patent
Estimating the term…
Abstract
A method for improved ATE (automatic test equipment) timing calibration at a DUT (device under test). The method includes step of accessing a DUT component using an ATE component and performing physical calibration on a first portion of signal pathways coupling the ATE component to the DUT component. A simulation based calibration is performed on a second portion of signal pathways coupling the ATE component to the DUT component. The physical calibration results are combined with simulation based calibration results to calibrate timing propagation delay between the ATE component and the DUT component.
Claims32
A method for improved ATE (automatic test equipment) timing calibration at a DUT (device under test), comprising:
- accessing a DUT component using an ATE component;
- performing physical calibration on a first portion of signal pathways coupling the ATE component to the DUT component;
- performing a simulation based calibration on a second portion of signal pathways coupling the ATE component to the DUT component;
- and
- combining physical calibration results with simulation based calibration results to calibrate timing propagation delay between the ATE component and the DUT component.
A system for improved ATE (automatic test equipment) timing calibration at a DUT (device under test), comprising:
- an ATE component configured for accessing a DUT component, the ATE component configured to perform physical calibration on a first portion of signal pathways coupling the ATE component to the DUT component;
- and
- a computer system for performing a simulation based calibration on a second portion of signal pathways coupling the ATE component to the DUT component, wherein physical calibration results are combined with simulation based calibration results to calibrate timing propagation delay between the ATE component and the DUT component.
A method for improved ATE (automatic test equipment) timing calibration at a DUT (device under test), comprising:
- accessing a DUT component using an ATE component;
- performing physical calibration on a first portion of signal pathways coupling the ATE component to the DUT component;
- performing a simulation based calibration on a second portion of signal pathways coupling the ATE component to the DUT component;
- and
- algebraically adding physical calibration results with simulation based calibration results to calibrate timing propagation delay between the ATE component and the DUT component.
A method for improved ATE (automatic test equipment) timing calibration at a DUT (device under test), comprising:
- accessing a DUT component using an ATE component;
- performing a simulation based calibration on signal pathways coupling the ATE component to the DUT component;
- and
- using simulation based calibration results to calibrate timing propagation delay between the ATE component and the DUT component.
A method for improved ATE (automatic test equipment) timing calibration at a DUT (device under test), comprising:
- accessing a DUT component using an ATE component;
- performing physical calibration on a first portion of signal pathways coupling the ATE component to the DUT component, wherein interpolation/extrapolation is used to reduce a number of physical measurements required for covering a plurality of data rates and voltage ranges available to the DUT component;
- performing a simulation based calibration on a second portion of signal pathways coupling the ATE component to the DUT component;
- and
- combining calibration results with simulation based calibration results to calibrate timing propagation delay between the ATE component and the DUT component.
A method for improved ATE (automatic test equipment) timing calibration at a DUT (device under test), comprising:
- accessing a DUT component using an ATE component;
- performing physical calibration on a first portion of signal pathways coupling the ATE component to the DUT component and calibrating signal continuity of the DUT component utilizing signal reflection analysis;
- performing a simulation based calibration on a second portion of signal pathways coupling the ATE component to the DUT component;
- and
- combining calibration results with simulation based calibration results to calibrate timing propagation delay between the ATE component and the DUT component.
Dependencies are inferred from the claim text.