Wire fault detection
AssigneeSimmonds Precision Products, Inc.
InventorsEric Robert Bechhoefer, Mokhtar Sadok
Life of this patent
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AssigneeSimmonds Precision Products, Inc.
InventorsEric Robert Bechhoefer, Mokhtar Sadok
Estimating the term…
Described are techniques used in a wire diagnostics system to detect events, such as defects, that may occur within a wire or cable under test. An incident voltage signal is sent out on the wire and a measured voltage signal is obtained which includes the incident voltage and the reflected voltage. Compensation processing is performed on the measured waveform to remove unwanted reflective components. Additionally, the waveform is then subject to attenuation processing and event detection processing. Detected events, such as defects, are classified and output as results. Events are classified by parametric classification using a library of known events or faults. The library of known events or faults is previously generated using empirical analysis and modeling techniques. Additionally, joint time-frequency domain reflectometry (TFDR) techniques are described for event identification and classification for a wire under test.
A method for detecting an event on a wire comprising:
A computer program product for detecting an event on a wire comprising:
A method for detecting an event on a wire comprising:
A computer program product for detecting an event on a wire comprising:
A method for detecting an event on a wire comprising:
A method for detecting an event on a wire comprising:
A method for detecting an event on a wire comprising:
A computer program product for detecting an event on a wire comprising code that:
A computer program product for detecting an event on a wire comprising code that:
A computer program product for detecting an event on a wire comprising code that:
Dependencies are inferred from the claim text.